Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires
Research output: Contribution to journal › Journal article › Research › peer-review
Original language | English |
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Article number | 165433 |
Journal | Physical Review B |
Volume | 96 |
Issue number | 16 |
Number of pages | 7 |
ISSN | 2469-9950 |
DOIs | |
Publication status | Published - 19 Oct 2017 |
Bibliographical note
[Qdev]
ID: 185228649