Conductance enhancement in quantum point contact-semiconductor-superconductor devices
Research output: Contribution to journal › Journal article › Research › peer-review
Standard
Conductance enhancement in quantum point contact-semiconductor-superconductor devices. / Mortensen, Niels Asger; Jauho, Antti-Pekka; Flensberg, Karsten; Henning, Schomerus.
In: Physical Review B. Condensed Matter and Materials Physics, Vol. 60, 1999, p. 13762.Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Mortensen, NA, Jauho, A-P, Flensberg, K & Henning, S 1999, 'Conductance enhancement in quantum point contact-semiconductor-superconductor devices', Physical Review B. Condensed Matter and Materials Physics, vol. 60, pp. 13762.
APA
Mortensen, N. A., Jauho, A-P., Flensberg, K., & Henning, S. (1999). Conductance enhancement in quantum point contact-semiconductor-superconductor devices. Physical Review B. Condensed Matter and Materials Physics, 60, 13762.
Vancouver
Mortensen NA, Jauho A-P, Flensberg K, Henning S. Conductance enhancement in quantum point contact-semiconductor-superconductor devices. Physical Review B. Condensed Matter and Materials Physics. 1999;60:13762.
Author
Bibtex
@article{cee2737074c811dbbee902004c4f4f50,
title = "Conductance enhancement in quantum point contact-semiconductor-superconductor devices",
author = "Mortensen, {Niels Asger} and Antti-Pekka Jauho and Karsten Flensberg and Schomerus Henning",
note = "Paper id:: http://dx.doi.org/10.1103/PhysRevB.60.13762",
year = "1999",
language = "English",
volume = "60",
pages = "13762",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
}
RIS
TY - JOUR
T1 - Conductance enhancement in quantum point contact-semiconductor-superconductor devices
AU - Mortensen, Niels Asger
AU - Jauho, Antti-Pekka
AU - Flensberg, Karsten
AU - Henning, Schomerus
N1 - Paper id:: http://dx.doi.org/10.1103/PhysRevB.60.13762
PY - 1999
Y1 - 1999
M3 - Journal article
VL - 60
SP - 13762
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
ER -
ID: 188334