Doubling the mobility of InAs/InGaAs selective area grown nanowires
Research output: Contribution to journal › Journal article › peer-review
Documents
- PhysRevMaterials.6.034602
Final published version, 2.39 MB, PDF document
Selective area growth (SAG) of nanowires and networks promise a route toward scalable electronics, photonics, and quantum devices based on III-V semiconductor materials. The potential of high-mobility SAG nanowires however is not yet fully realised, since interfacial roughness, misfit dislocations at the nanowire/substrate interface and nonuniform composition due to material intermixing all scatter electrons. Here, we explore SAG of highly lattice-mismatched InAs nanowires on insulating GaAs(001) substrates and address these key challenges. Atomically smooth nanowire/substrate interfaces are achieved with the use of atomic hydrogen (a-H) as an alternative to conventional thermal annealing for the native oxide removal. The problem of high lattice mismatch is addressed through an InxGa1-xAs buffer layer introduced between the InAs transport channel and the GaAs substrate. The Ga-In material intermixing observed in both the buffer layer and the channel is inhibited via careful tuning of the growth temperature. Performing scanning transmission electron microscopy and x-ray diffraction analysis along with low-temperature transport measurements we show that optimized In-rich buffer layers promote high-quality InAs transport channels with the field-effect electron mobility over 10 000 cm(2) V-1 s(-1). This is twice as high as for nonoptimized samples and among the highest reported for InAs selective area grown nanostructures.
Original language | English |
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Article number | 034602 |
Journal | Physical Review Materials |
Volume | 6 |
Issue number | 3 |
Number of pages | 9 |
ISSN | 2475-9953 |
DOIs | |
Publication status | Published - 16 Mar 2022 |
- MOLECULAR-BEAM EPITAXY, ELECTRONIC-PROPERTIES, ALLOY SCATTERING, GAAS, DESORPTION, OXIDE, SEGREGATION, SUBSTRATE, SURFACES, GE
Research areas
Links
- https://arxiv.org/pdf/2103.15971.pdf
Submitted manuscript
ID: 302060660