Imaging electromigration during the formation of break junctions.

Research output: Contribution to journalJournal articlepeer-review

Documents

  • Nl062631i

    Final published version, 129 KB, PDF document

Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
Original languageEnglish
JournalNano Letters
Volume7
Issue number3
Pages (from-to)652-656
Number of pages5
ISSN1530-6984
DOIs
Publication statusPublished - 1 Jan 2007
Externally publishedYes

Number of downloads are based on statistics from Google Scholar and www.ku.dk


No data available

ID: 44225491