Imaging electromigration during the formation of break junctions.
Research output: Contribution to journal › Journal article › Research › peer-review
Final published version, 129 KB, PDF document
Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
|Number of pages||5|
|Publication status||Published - 1 Jan 2007|
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