Evaluating Xilinx 7 Series GTX Transceivers for Use in High Energy Physics Experiments Through Proton Irradiation
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Evaluating Xilinx 7 Series GTX Transceivers for Use in High Energy Physics Experiments Through Proton Irradiation. / Cannon, Matthew; Wirthlin, Michael; Camplani, Alessandra; Citterio, Mauro; Meroni, Chiara.
I: IEEE Transactions on Nuclear Science, Bind 62, Nr. 6, 7348745, 2015, s. 2695-2702.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
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TY - JOUR
T1 - Evaluating Xilinx 7 Series GTX Transceivers for Use in High Energy Physics Experiments Through Proton Irradiation
AU - Cannon, Matthew
AU - Wirthlin, Michael
AU - Camplani, Alessandra
AU - Citterio, Mauro
AU - Meroni, Chiara
N1 - Publisher Copyright: © 1963-2012 IEEE.
PY - 2015
Y1 - 2015
N2 - This paper presents an examination of the Xilinx 7-Series GTX transceiver for use in High Energy Physics (HEP) experiments with special emphasis on the environment expected in the ATLAS Liquid Argon (LAr) subsystem. Two Xilinx Kintex 325T devices were tested with a 180 MeV proton beam at the TSL facility in Sweden. The beam test architecture monitors the GTX transceivers for lane failures and bit errors in the data streams from the 13 links sent from the Device Under Test (DUT). The DUT was exposed to 1.55 times 10{13} hbox{protons/cm}2 over a non-continuous period of 24 hours. The cross section of the GTX to any failure was calculated to be approximately 7.32 times 10 {-12}hbox{cm}{2}/hbox{lane} which translates to an error every 17 minutes for a full LAr subsystem involving 2 times 10{4} hbox{lanes}. No permanent damage was observed on any of the GTX links or other parts of the FPGA. A slight increase in current on the VCCINT power supply was observed at the end of the test.
AB - This paper presents an examination of the Xilinx 7-Series GTX transceiver for use in High Energy Physics (HEP) experiments with special emphasis on the environment expected in the ATLAS Liquid Argon (LAr) subsystem. Two Xilinx Kintex 325T devices were tested with a 180 MeV proton beam at the TSL facility in Sweden. The beam test architecture monitors the GTX transceivers for lane failures and bit errors in the data streams from the 13 links sent from the Device Under Test (DUT). The DUT was exposed to 1.55 times 10{13} hbox{protons/cm}2 over a non-continuous period of 24 hours. The cross section of the GTX to any failure was calculated to be approximately 7.32 times 10 {-12}hbox{cm}{2}/hbox{lane} which translates to an error every 17 minutes for a full LAr subsystem involving 2 times 10{4} hbox{lanes}. No permanent damage was observed on any of the GTX links or other parts of the FPGA. A slight increase in current on the VCCINT power supply was observed at the end of the test.
KW - Field programmable gate arrays (FP-GAs)
KW - Giga-Bit transceiver (GBT)
KW - high energy physics
KW - multi-gigabit transceivers (MGTs)
KW - proton irradiation
KW - xilinx GTX transceivers
U2 - 10.1109/TNS.2015.2497216
DO - 10.1109/TNS.2015.2497216
M3 - Journal article
AN - SCOPUS:84961821457
VL - 62
SP - 2695
EP - 2702
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
SN - 0018-9499
IS - 6
M1 - 7348745
ER -
ID: 309283185