Imaging electromigration during the formation of break junctions.
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
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- Nl062631i
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Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.
Originalsprog | Engelsk |
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Tidsskrift | Nano Letters |
Vol/bind | 7 |
Udgave nummer | 3 |
Sider (fra-til) | 652-656 |
Antal sider | 5 |
ISSN | 1530-6984 |
DOI | |
Status | Udgivet - 1 jan. 2007 |
Eksternt udgivet | Ja |
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