Robert Krarup Feidenhans'l

Robert Krarup Feidenhans'l

Professor, Visiting professor

ORCID: 0000-0002-7963-3649

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  1. Published

    Directional x-ray dark-field imaging of strongly ordered systems

    Jensen....[et al.), T. H., Bech, M. & Feidenhans'l, Robert Krarup, 6 Dec 2010, In: Physical Review B. 82, 21, p. 214103 8 p.

    Research output: Contribution to journal › Journal article › Research › peer-review

  2. Published

    Adaptive center determination for effective suppression of ring artifacts in tomography images

    Jha, D., Sørensen, H. O., Dobberschütz, S., Feidenhans'l, Robert Krarup & Stipp, S. L. S., 2014, In: Applied Physics Letters. 105, 4 p., 143107.

    Research output: Contribution to journal › Journal article › Research › peer-review

  3. Published

    McXtrace: a modern ray-tracing package for x-ray instrumentation

    Knudsen, E. B., Prodi, A., Willendrup, P. K., Lefmann, Kim, Baltser, J., Gundlach, C., Sanchez del Rio, M., Ferrero, C. & Feidenhans'l, Robert Krarup, 23 Sep 2011, In: Proceedings of SPIE. 8141, p. 81410G-81410G-7

    Research output: Contribution to journal › Conference article › Research › peer-review

  4. Published

    Towards scanning nanostructure X-ray microscopy

    Kovyakh, A., Banerjee, S., Liu, C., Wright, C. J., Li, Y. C., Mallouk, T. E., Feidenhans'l, Robert Krarup & Billinge, S. J. L., 1 Aug 2023, In: Journal of Applied Crystallography. 56, 4, p. 1221-1228 8 p.

    Research output: Contribution to journal › Journal article › Research › peer-review

  5. Published

    In-situ x-ray characterization of wurtzite formation in GaAs nanowires

    Krogstrup, Peter, Madsen, M. H., Wen, H., Miwa, K., Nygård, Jesper, Masamitu, T. & Feidenhans'l, Robert Krarup, 27 Feb 2012, In: Applied Physics Letters. 100, 9, 4 p., 093103.

    Research output: Contribution to journal › Journal article › Research › peer-review

  6. Published

    Imaging the pore space in chalk using X-ray tomography

    Kynde, S. A. R., Sperling, L., Feidenhans'l, Robert Krarup & Stipp, S. L. S., 2009.

    Research output: Contribution to conference › Poster › Research

  7. Published

    Detection of sub-pixel fractures in X-ray dark-field tomography

    Lauridsen, T., Willner, M., Bech, M., Pfeiffer, F. & Feidenhans'l, Robert Krarup, 2 Nov 2015, In: Applied Physics A: Materials Science & Processing. 121, 3, p. 1243-1250

    Research output: Contribution to journal › Journal article › Research › peer-review

  8. Published

    Visualisation by high resolution synchrotron X-ray phase contrast micro-tomography of gas films on submerged superhydrophobic leaves

    Lauridsen, T., Glavina, K., Colmer, T. D., Winkel, A., Irvine, S., Lefmann, Kim, Feidenhans'l, Robert Krarup & Pedersen, Ole, 1 Oct 2014, In: Journal of Structural Biology. 188, 1, p. 61-70

    Research output: Contribution to journal › Journal article › Research › peer-review

  9. Published

    Mapping misoriented fibers using X-ray dark field tomography

    Lauridsen, T., Feidenhans'l, Robert Krarup & Lauridsen, E. M., 1 Jun 2014, In: Applied Physics A: Materials Science & Processing. 115, 3, p. 741-745

    Research output: Contribution to journal › Journal article › Research › peer-review

  10. Published

    Revealing misfit dislocations InAsxP1-x-InP core-shell nanowires by x-ray diffraction

    Lazarev, S., Goransson, D. J. O., Borgstrom, M., Messing, M. E., Xu, H. Q., Dzhigaev, D., Yefanov, O. M., Bauer, S., Baumbach, T., Feidenhans'l, Robert Krarup, Samuelson, L. & Vartanyants, I. A., 13 Dec 2019, In: Nanotechnology. 30, 50, 12 p., 205703.

    Research output: Contribution to journal › Journal article › Research › peer-review

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