Standard
McXtrace : a modern ray-tracing package for x-ray instrumentation. / Knudsen, E.B.; Prodi, Andrea; Willendrup, Peter Kjær; Lefmann, Kim; Baltser, Jana; Gundlach, C.; Sanchez del Rio, M.; Ferrero, C.; Feidenhans'l, Robert Krarup.
In:
Proceedings of SPIE, Vol. 8141, 23.09.2011, p. 81410G-81410G-7.
Research output: Contribution to journal › Conference article › Research › peer-review
Harvard
Knudsen, EB, Prodi, A, Willendrup, PK
, Lefmann, K, Baltser, J, Gundlach, C, Sanchez del Rio, M, Ferrero, C
& Feidenhans'l, RK 2011, '
McXtrace: a modern ray-tracing package for x-ray instrumentation',
Proceedings of SPIE, vol. 8141, pp. 81410G-81410G-7.
https://doi.org/10.1117/12.894179APA
Knudsen, E. B., Prodi, A., Willendrup, P. K.
, Lefmann, K., Baltser, J., Gundlach, C., Sanchez del Rio, M., Ferrero, C.
, & Feidenhans'l, R. K. (2011).
McXtrace: a modern ray-tracing package for x-ray instrumentation.
Proceedings of SPIE,
8141, 81410G-81410G-7.
https://doi.org/10.1117/12.894179Vancouver
Knudsen EB, Prodi A, Willendrup PK
, Lefmann K, Baltser J, Gundlach C et al.
McXtrace: a modern ray-tracing package for x-ray instrumentation.
Proceedings of SPIE. 2011 Sep 23;8141:81410G-81410G-7.
https://doi.org/10.1117/12.894179Author
Knudsen, E.B. ; Prodi, Andrea ; Willendrup, Peter Kjær ; Lefmann, Kim ; Baltser, Jana ; Gundlach, C. ; Sanchez del Rio, M. ; Ferrero, C. ; Feidenhans'l, Robert Krarup. / McXtrace : a modern ray-tracing package for x-ray instrumentation. In: Proceedings of SPIE. 2011 ; Vol. 8141. pp. 81410G-81410G-7.
Bibtex
@inproceedings{6a60c6b329d64374bf1cb0d39f31e39f,
title = "McXtrace: a modern ray-tracing package for x-ray instrumentation",
author = "E.B. Knudsen and Andrea Prodi and Willendrup, {Peter Kj{\ae}r} and Kim Lefmann and Jana Baltser and C. Gundlach and {Sanchez del Rio}, M. and C. Ferrero and Feidenhans'l, {Robert Krarup}",
year = "2011",
month = sep,
day = "23",
doi = "10.1117/12.894179",
language = "English",
volume = "8141",
pages = "81410G--81410G--7",
journal = "Proceedings of S P I E - International Society for Optical Engineering",
issn = "0277-786X",
publisher = "International Society for Optical Engineering",
}
RIS
TY - GEN
T1 - McXtrace
T2 - a modern ray-tracing package for x-ray instrumentation
AU - Knudsen, E.B.
AU - Prodi, Andrea
AU - Willendrup, Peter Kjær
AU - Lefmann, Kim
AU - Baltser, Jana
AU - Gundlach, C.
AU - Sanchez del Rio, M.
AU - Ferrero, C.
AU - Feidenhans'l, Robert Krarup
PY - 2011/9/23
Y1 - 2011/9/23
U2 - 10.1117/12.894179
DO - 10.1117/12.894179
M3 - Conference article
VL - 8141
SP - 81410G-81410G-7
JO - Proceedings of S P I E - International Society for Optical Engineering
JF - Proceedings of S P I E - International Society for Optical Engineering
SN - 0277-786X
ER -
