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Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires. / Tanta, Rawa; Lindberg, Caroline; Lehmann, Sebastian; Bolinsson, Jessica; Carro-Temboury, Miguel R.; Dick, Kimberly A.; Vosch, Tom; Jespersen, Thomas Sand; Nygard, Jesper.
In:
Physical Review B, Vol. 96, No. 16, 165433, 19.10.2017.
Research output: Contribution to journal › Journal article › Research › peer-review
Harvard
Tanta, R, Lindberg, C, Lehmann, S, Bolinsson, J, Carro-Temboury, MR, Dick, KA
, Vosch, T, Jespersen, TS
& Nygard, J 2017, '
Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires',
Physical Review B, vol. 96, no. 16, 165433.
https://doi.org/10.1103/PhysRevB.96.165433APA
Tanta, R., Lindberg, C., Lehmann, S., Bolinsson, J., Carro-Temboury, M. R., Dick, K. A.
, Vosch, T., Jespersen, T. S.
, & Nygard, J. (2017).
Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires.
Physical Review B,
96(16), [165433].
https://doi.org/10.1103/PhysRevB.96.165433Vancouver
Tanta R, Lindberg C, Lehmann S, Bolinsson J, Carro-Temboury MR, Dick KA et al.
Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires.
Physical Review B. 2017 Oct 19;96(16). 165433.
https://doi.org/10.1103/PhysRevB.96.165433Author
Tanta, Rawa ; Lindberg, Caroline ; Lehmann, Sebastian ; Bolinsson, Jessica ; Carro-Temboury, Miguel R. ; Dick, Kimberly A. ; Vosch, Tom ; Jespersen, Thomas Sand ; Nygard, Jesper. / Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires. In: Physical Review B. 2017 ; Vol. 96, No. 16.
Bibtex
@article{ccd4bd0fa9ea405d9c5b59ad996b28f6,
title = "Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires",
author = "Rawa Tanta and Caroline Lindberg and Sebastian Lehmann and Jessica Bolinsson and Carro-Temboury, {Miguel R.} and Dick, {Kimberly A.} and Tom Vosch and Jespersen, {Thomas Sand} and Jesper Nygard",
note = "[Qdev]",
year = "2017",
month = oct,
day = "19",
doi = "10.1103/PhysRevB.96.165433",
language = "English",
volume = "96",
journal = "Physical Review B",
issn = "2469-9950",
publisher = "American Physical Society",
number = "16",
}
RIS
TY - JOUR
T1 - Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires
AU - Tanta, Rawa
AU - Lindberg, Caroline
AU - Lehmann, Sebastian
AU - Bolinsson, Jessica
AU - Carro-Temboury, Miguel R.
AU - Dick, Kimberly A.
AU - Vosch, Tom
AU - Jespersen, Thomas Sand
AU - Nygard, Jesper
N1 - [Qdev]
PY - 2017/10/19
Y1 - 2017/10/19
U2 - 10.1103/PhysRevB.96.165433
DO - 10.1103/PhysRevB.96.165433
M3 - Journal article
VL - 96
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
IS - 16
M1 - 165433
ER -
