High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions
Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning
Standard
High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions. / Dahmen, U.; Johnson, E.; Xiao, S. Q.; Johansen, A.
I: MRS Bulletin, Nr. 22-8, 1997, s. 49-52.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning
Harvard
Dahmen, U, Johnson, E, Xiao, SQ & Johansen, A 1997, 'High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions', MRS Bulletin, nr. 22-8, s. 49-52.
APA
Dahmen, U., Johnson, E., Xiao, S. Q., & Johansen, A. (1997). High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions. MRS Bulletin, (22-8), 49-52.
Vancouver
Dahmen U, Johnson E, Xiao SQ, Johansen A. High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions. MRS Bulletin. 1997;(22-8):49-52.
Author
Bibtex
@article{9ea3b92074c911dbbee902004c4f4f50,
title = "High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions",
author = "U. Dahmen and E. Johnson and Xiao, {S. Q.} and A. Johansen",
note = "OEL",
year = "1997",
language = "English",
pages = "49--52",
journal = "M R S Bulletin",
issn = "0883-7694",
publisher = "Cambridge University Press",
number = "22-8",
}
RIS
TY - JOUR
T1 - High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions
AU - Dahmen, U.
AU - Johnson, E.
AU - Xiao, S. Q.
AU - Johansen, A.
N1 - OEL
PY - 1997
Y1 - 1997
M3 - Journal article
SP - 49
EP - 52
JO - M R S Bulletin
JF - M R S Bulletin
SN - 0883-7694
IS - 22-8
ER -
ID: 201919