Nanoscale Lead Inclusions in Silicon
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Standard
Nanoscale Lead Inclusions in Silicon. / Johnson, Erik; Johansen, Hans Allan; Sarholt-Kristensen, Leif.
I: Microscopy and Microanalysis, Nr. 5, suppl. 2, 1999, s. 762-763.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
Harvard
Johnson, E, Johansen, HA & Sarholt-Kristensen, L 1999, 'Nanoscale Lead Inclusions in Silicon', Microscopy and Microanalysis, nr. 5, suppl. 2, s. 762-763.
APA
Johnson, E., Johansen, H. A., & Sarholt-Kristensen, L. (1999). Nanoscale Lead Inclusions in Silicon. Microscopy and Microanalysis, (5, suppl. 2), 762-763.
Vancouver
Johnson E, Johansen HA, Sarholt-Kristensen L. Nanoscale Lead Inclusions in Silicon. Microscopy and Microanalysis. 1999;(5, suppl. 2):762-763.
Author
Bibtex
@article{cc7284e074c811dbbee902004c4f4f50,
title = "Nanoscale Lead Inclusions in Silicon",
author = "Erik Johnson and Johansen, {Hans Allan} and Leif Sarholt-Kristensen",
year = "1999",
language = "English",
pages = "762--763",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "5, suppl. 2",
}
RIS
TY - JOUR
T1 - Nanoscale Lead Inclusions in Silicon
AU - Johnson, Erik
AU - Johansen, Hans Allan
AU - Sarholt-Kristensen, Leif
PY - 1999
Y1 - 1999
M3 - Journal article
SP - 762
EP - 763
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
SN - 1431-9276
IS - 5, suppl. 2
ER -
ID: 188201