Standard
Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry. / Liu, Y.C.; Thyd'en, K; Xing, Q; Johnson, E.
-. -. udg. Risø(DK) : Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi, 2005. s. 273-278.
Publikation: Bidrag til bog/antologi/rapport › Bidrag til bog/antologi › Formidling
Harvard
Liu, YC, Thyd'en, K, Xing, Q & Johnson, E 2005, Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry. i -. - udg, Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi, Risø(DK), s. 273-278.
APA
Liu, Y. C., Thyd'en, K., Xing, Q., & Johnson, E. (2005). Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry. I - (- udg., s. 273-278). Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi.
Vancouver
Liu YC, Thyd'en K, Xing Q, Johnson E. Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry. I -. - udg. Risø(DK): Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi. 2005. s. 273-278
Author
Liu, Y.C. ; Thyd'en, K ; Xing, Q ; Johnson, E. / Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry. -. -. udg. Risø(DK) : Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi, 2005. s. 273-278
Bibtex
@inbook{37bdb77074be11dbbee902004c4f4f50,
title = "Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry",
abstract = "Electron microscopy",
author = "Y.C. Liu and K Thyd'en and Q Xing and E. Johnson",
year = "2005",
language = "English",
pages = "273--278",
booktitle = "-",
publisher = "Danmarks Tekniske Universitet, Ris{\o} Nationallaboratoriet for B{\ae}redygtig Energi",
edition = "-",
}
RIS
TY - CHAP
T1 - Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry
AU - Liu, Y.C.
AU - Thyd'en, K
AU - Xing, Q
AU - Johnson, E.
PY - 2005
Y1 - 2005
N2 - Electron microscopy
AB - Electron microscopy
M3 - Book chapter
SP - 273
EP - 278
BT - -
PB - Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi
CY - Risø(DK)
ER -
