Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy

Research output: Contribution to conferencePaperResearch

Standard

Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy. / Simonsen, S.B.; Dahl, S.; Johnson, Erik; Helveg, S.

2008. Paper presented at SAE  World Congress, Detroit, United States.

Research output: Contribution to conferencePaperResearch

Harvard

Simonsen, SB, Dahl, S, Johnson, E & Helveg, S 2008, 'Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy', Paper presented at SAE  World Congress, Detroit, United States, 14/04/2008 - 17/04/2008.

APA

Simonsen, S. B., Dahl, S., Johnson, E., & Helveg, S. (2008). Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy. Paper presented at SAE  World Congress, Detroit, United States.

Vancouver

Simonsen SB, Dahl S, Johnson E, Helveg S. Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy. 2008. Paper presented at SAE  World Congress, Detroit, United States.

Author

Simonsen, S.B. ; Dahl, S. ; Johnson, Erik ; Helveg, S. / Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy. Paper presented at SAE  World Congress, Detroit, United States.

Bibtex

@conference{0a167aa0bc6f11dd8e02000ea68e967b,
title = "Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy",
author = "S.B. Simonsen and S. Dahl and Erik Johnson and S. Helveg",
note = "SAE= Society of Automotive Engineers; null ; Conference date: 14-04-2008 Through 17-04-2008",
year = "2008",
language = "English",

}

RIS

TY - CONF

T1 - Direct observations of CeO2-catalyzed soot oxidation at the nanoscale using environmental tramsission electron microscopy

AU - Simonsen, S.B.

AU - Dahl, S.

AU - Johnson, Erik

AU - Helveg, S.

N1 - Conference code: 2008

PY - 2008

Y1 - 2008

M3 - Paper

Y2 - 14 April 2008 through 17 April 2008

ER -

ID: 8776240