Membrane-Based Scanning Force Microscopy
Research output: Contribution to journal › Journal article › Research › peer-review
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Membrane-Based Scanning Force Microscopy. / Halg, David; Gisler, Thomas; Tsaturyan, Yeghishe; Catalini, Letizia; Grob, Urs; Krass, Marc-Dominik; Heritier, Martin; Mattiat, Hinrich; Thamm, Ann-Katrin; Schirhagl, Romana; Langman, Eric C.; Schliesser, Albert; Degen, Christian L.; Eichler, Alexander.
In: Physical Review Applied, Vol. 15, No. 2, 021001, 05.02.2021.Research output: Contribution to journal › Journal article › Research › peer-review
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TY - JOUR
T1 - Membrane-Based Scanning Force Microscopy
AU - Halg, David
AU - Gisler, Thomas
AU - Tsaturyan, Yeghishe
AU - Catalini, Letizia
AU - Grob, Urs
AU - Krass, Marc-Dominik
AU - Heritier, Martin
AU - Mattiat, Hinrich
AU - Thamm, Ann-Katrin
AU - Schirhagl, Romana
AU - Langman, Eric C.
AU - Schliesser, Albert
AU - Degen, Christian L.
AU - Eichler, Alexander
N1 - Hy-Q
PY - 2021/2/5
Y1 - 2021/2/5
N2 - We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry-in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.
AB - We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry-in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.
U2 - 10.1103/PhysRevApplied.15.L021001
DO - 10.1103/PhysRevApplied.15.L021001
M3 - Journal article
VL - 15
JO - Physical Review Applied
JF - Physical Review Applied
SN - 2331-7019
IS - 2
M1 - 021001
ER -
ID: 258656959