Charging effects in tunnel junctions: A four level study

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Standard

Charging effects in tunnel junctions : A four level study. / Flensberg, Karsten; Frota, H. O.

In: Solid State Communications, Vol. 77, No. 12, 01.01.1991, p. 917-921.

Research output: Contribution to journal › Journal article › Research › peer-review

Harvard

Flensberg, K & Frota, HO 1991, 'Charging effects in tunnel junctions: A four level study', Solid State Communications, vol. 77, no. 12, pp. 917-921. https://doi.org/10.1016/0038-1098(91)90346-W

APA

Flensberg, K., & Frota, H. O. (1991). Charging effects in tunnel junctions: A four level study. Solid State Communications, 77(12), 917-921. https://doi.org/10.1016/0038-1098(91)90346-W

Vancouver

Flensberg K, Frota HO. Charging effects in tunnel junctions: A four level study. Solid State Communications. 1991 Jan 1;77(12):917-921. https://doi.org/10.1016/0038-1098(91)90346-W

Author

Flensberg, Karsten ; Frota, H. O. / Charging effects in tunnel junctions : A four level study. In: Solid State Communications. 1991 ; Vol. 77, No. 12. pp. 917-921.

Bibtex

@article{b9cd59a3faf64fe6b396b2abd593a4cb,
title = "Charging effects in tunnel junctions: A four level study",
abstract = "Charging effects in small tunnel junctions are studied via a transformation which, following Wilson, allows us to treat the hybridization between the two sides and the charging energy exactly. The two conduction bands are transformed to the so-called {"}hopping{"} Hamiltonian. The transformation makes the model suitable for a full renormalization group calculation. Here we study a simplified version of this Hamiltonian. We keep only the first term that hybridize directly the two bands and which involves the charging energy and the junction coupling strength. The resulting four level system is solved exactly and the eigenvalues, the meansquare charge difference, and the charge transfer fluctuations are calculated.",
author = "Karsten Flensberg and Frota, {H. O.}",
year = "1991",
month = jan,
day = "1",
doi = "10.1016/0038-1098(91)90346-W",
language = "English",
volume = "77",
pages = "917--921",
journal = "Solid State Communications",
issn = "0038-1098",
publisher = "Pergamon Press",
number = "12",

}

RIS

TY - JOUR

T1 - Charging effects in tunnel junctions

T2 - A four level study

AU - Flensberg, Karsten

AU - Frota, H. O.

PY - 1991/1/1

Y1 - 1991/1/1

N2 - Charging effects in small tunnel junctions are studied via a transformation which, following Wilson, allows us to treat the hybridization between the two sides and the charging energy exactly. The two conduction bands are transformed to the so-called "hopping" Hamiltonian. The transformation makes the model suitable for a full renormalization group calculation. Here we study a simplified version of this Hamiltonian. We keep only the first term that hybridize directly the two bands and which involves the charging energy and the junction coupling strength. The resulting four level system is solved exactly and the eigenvalues, the meansquare charge difference, and the charge transfer fluctuations are calculated.

AB - Charging effects in small tunnel junctions are studied via a transformation which, following Wilson, allows us to treat the hybridization between the two sides and the charging energy exactly. The two conduction bands are transformed to the so-called "hopping" Hamiltonian. The transformation makes the model suitable for a full renormalization group calculation. Here we study a simplified version of this Hamiltonian. We keep only the first term that hybridize directly the two bands and which involves the charging energy and the junction coupling strength. The resulting four level system is solved exactly and the eigenvalues, the meansquare charge difference, and the charge transfer fluctuations are calculated.

UR - http://www.scopus.com/inward/record.url?scp=0026124053&partnerID=8YFLogxK

U2 - 10.1016/0038-1098(91)90346-W

DO - 10.1016/0038-1098(91)90346-W

M3 - Journal article

AN - SCOPUS:0026124053

VL - 77

SP - 917

EP - 921

JO - Solid State Communications

JF - Solid State Communications

SN - 0038-1098

IS - 12

ER -

ID: 199596486