Dephasing in semiconductor-superconductor structures by coupling to a voltage probe

Research output: Contribution to journalJournal articlepeer-review

Standard

Dephasing in semiconductor-superconductor structures by coupling to a voltage probe. / Mortensen, Niels Asger; Jauho, Antti-Pekka; Flensberg, Karsten.

In: Superlattices and Microstructures, Vol. 28, No. 1, 2000, p. 67-76.

Research output: Contribution to journalJournal articlepeer-review

Harvard

Mortensen, NA, Jauho, A-P & Flensberg, K 2000, 'Dephasing in semiconductor-superconductor structures by coupling to a voltage probe', Superlattices and Microstructures, vol. 28, no. 1, pp. 67-76.

APA

Mortensen, N. A., Jauho, A-P., & Flensberg, K. (2000). Dephasing in semiconductor-superconductor structures by coupling to a voltage probe. Superlattices and Microstructures, 28(1), 67-76.

Vancouver

Mortensen NA, Jauho A-P, Flensberg K. Dephasing in semiconductor-superconductor structures by coupling to a voltage probe. Superlattices and Microstructures. 2000;28(1):67-76.

Author

Mortensen, Niels Asger ; Jauho, Antti-Pekka ; Flensberg, Karsten. / Dephasing in semiconductor-superconductor structures by coupling to a voltage probe. In: Superlattices and Microstructures. 2000 ; Vol. 28, No. 1. pp. 67-76.

Bibtex

@article{009e7ef074c811dbbee902004c4f4f50,
title = "Dephasing in semiconductor-superconductor structures by coupling to a voltage probe",
abstract = "We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.",
author = "Mortensen, {Niels Asger} and Antti-Pekka Jauho and Karsten Flensberg",
note = "Paper id:: http://dx.doi.org/10.1006/spmi.2000.0890",
year = "2000",
language = "English",
volume = "28",
pages = "67--76",
journal = "Superlattices and Microstructures",
issn = "0749-6036",
publisher = "Academic Press",
number = "1",

}

RIS

TY - JOUR

T1 - Dephasing in semiconductor-superconductor structures by coupling to a voltage probe

AU - Mortensen, Niels Asger

AU - Jauho, Antti-Pekka

AU - Flensberg, Karsten

N1 - Paper id:: http://dx.doi.org/10.1006/spmi.2000.0890

PY - 2000

Y1 - 2000

N2 - We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.

AB - We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.

M3 - Journal article

VL - 28

SP - 67

EP - 76

JO - Superlattices and Microstructures

JF - Superlattices and Microstructures

SN - 0749-6036

IS - 1

ER -

ID: 176415