Fast Strain Mapping of Nanowire Light-Emitting Diodes Using Nanofocused X-ray Beams.
Research output: Contribution to journal › Journal article › Research › peer-review
| Original language | English |
|---|---|
| Journal | A C S Nano |
| Volume | 9 |
| Issue number | 7 |
| Pages (from-to) | 6978-6984 |
| Number of pages | 6 |
| ISSN | 1936-0851 |
| DOIs | |
| Publication status | Published - 23 Jun 2015 |
ID: 142948860