Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012)

Publikation: Andet › Andet bidrag › Forskning

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Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). / Johnson, Erik.

Nagoya University. 2012, -.

Publikation: Andet › Andet bidrag › Forskning

Harvard

Johnson, E 2012, Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). Nagoya University. <http://www.esi.nagoya-u.ac.jp/shinpo/poster_20120119.pdf?20121113>

APA

Johnson, E. (2012, jan. 19). Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). http://www.esi.nagoya-u.ac.jp/shinpo/poster_20120119.pdf?20121113

Vancouver

Johnson E. Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). 2012.

Author

Johnson, Erik. / Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). 2012. Nagoya University.

Bibtex

@misc{a4c33bb5f6274a6494cc2cb48335be16,
title = "Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012)",
author = "Erik Johnson",
year = "2012",
month = jan,
day = "19",
language = "English",
type = "Other",

}

RIS

TY - GEN

T1 - Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012)

AU - Johnson, Erik

PY - 2012/1/19

Y1 - 2012/1/19

M3 - Other contribution

CY - Nagoya University

ER -

ID: 41842980