Standard
TEM of free standing InAs nanoplates grown by molecular beam epitaxy. / Johnson, Erik; Aagesen, Martin; Sørensen, C.B.; Lindelof, Poul Erik; Spiecker, P.E.; Jäger, W.
I:
Microscopy and Microanalysis, Bind 13, Nr. Suppl. 3, 2007, s. 322-323.
Publikation: Bidrag til tidsskrift › Konferenceartikel › Forskning
Harvard
Johnson, E, Aagesen, M, Sørensen, CB, Lindelof, PE, Spiecker, PE & Jäger, W 2007, 'TEM of free standing InAs nanoplates grown by molecular beam epitaxy', Microscopy and Microanalysis, bind 13, nr. Suppl. 3, s. 322-323.
APA
Johnson, E., Aagesen, M., Sørensen, C. B., Lindelof, P. E., Spiecker, P. E., & Jäger, W. (2007). TEM of free standing InAs nanoplates grown by molecular beam epitaxy. Microscopy and Microanalysis, 13(Suppl. 3), 322-323.
Vancouver
Johnson E, Aagesen M, Sørensen CB, Lindelof PE, Spiecker PE, Jäger W. TEM of free standing InAs nanoplates grown by molecular beam epitaxy. Microscopy and Microanalysis. 2007;13(Suppl. 3):322-323.
Author
Johnson, Erik ; Aagesen, Martin ; Sørensen, C.B. ; Lindelof, Poul Erik ; Spiecker, P.E. ; Jäger, W. / TEM of free standing InAs nanoplates grown by molecular beam epitaxy. I: Microscopy and Microanalysis. 2007 ; Bind 13, Nr. Suppl. 3. s. 322-323.
Bibtex
@inproceedings{1259d070bebb11dcbee902004c4f4f50,
title = "TEM of free standing InAs nanoplates grown by molecular beam epitaxy",
author = "Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik} and P.E. Spiecker and W. J{\"a}ger",
year = "2007",
language = "English",
volume = "13",
pages = "322--323",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "Suppl. 3",
note = "null ; Conference date: 02-09-2007 Through 07-09-2007",
}
RIS
TY - GEN
T1 - TEM of free standing InAs nanoplates grown by molecular beam epitaxy
AU - Johnson, Erik
AU - Aagesen, Martin
AU - Sørensen, C.B.
AU - Lindelof, Poul Erik
AU - Spiecker, P.E.
AU - Jäger, W.
N1 - Conference code: 33
PY - 2007
Y1 - 2007
M3 - Conference article
VL - 13
SP - 322
EP - 323
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
SN - 1431-9276
IS - Suppl. 3
Y2 - 2 September 2007 through 7 September 2007
ER -
