X-ray tomography using the full complex index of refraction

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningfagfællebedømt

  • Mikkel Schou Nielsen
  • Torsten Lauridsen
  • M. Thomsen
  • Torben Haugaard Jensen
  • Martin Bech
  • L.B. Christensen
  • Olsen E. V.
  • Hviid M.
  • Feidenhans'l, Robert Krarup
  • F. Pfeiffer
We report on x-ray tomography using the full complex index of refraction recorded with a grating-based x-ray phase-contrast setup. Combining simultaneous absorption and phase-contrast information, the distribution of the full complex index of refraction is determined and depicted in a bivariate graph. A simple multivariable threshold segmentation can be applied offering higher accuracy than with a single-variable threshold segmentation as well as new possibilities for the partial volume analysis and edge detection. It is particularly beneficial for low-contrast systems. In this paper, this concept is demonstrated by experimental results
OriginalsprogEngelsk
TidsskriftPhysics in Medicine and Biology
Vol/bind57
Udgave nummer19
Sider (fra-til)5971-5979
Antal sider9
ISSN0031-9155
DOI
StatusUdgivet - 11 sep. 2012

ID: 40737240