Imaging electromigration during the formation of break junctions.

Research output: Contribution to journal › Journal article › peer-review

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Imaging electromigration during the formation of break junctions. / Taychatanapat, Thiti; Bolotin, Kirill I; Kuemmeth, Ferdinand; Ralph, Daniel C.

In: Nano Letters, Vol. 7, No. 3, 01.01.2007, p. 652-656.

Research output: Contribution to journal › Journal article › peer-review

Harvard

Taychatanapat, T, Bolotin, KI, Kuemmeth, F & Ralph, DC 2007, 'Imaging electromigration during the formation of break junctions.', Nano Letters, vol. 7, no. 3, pp. 652-656. https://doi.org/DOI: 10.1021/nl062631i

APA

Taychatanapat, T., Bolotin, K. I., Kuemmeth, F., & Ralph, D. C. (2007). Imaging electromigration during the formation of break junctions. Nano Letters, 7(3), 652-656. https://doi.org/DOI: 10.1021/nl062631i

Vancouver

Taychatanapat T, Bolotin KI, Kuemmeth F, Ralph DC. Imaging electromigration during the formation of break junctions. Nano Letters. 2007 Jan 1;7(3):652-656. https://doi.org/DOI: 10.1021/nl062631i

Author

Taychatanapat, Thiti ; Bolotin, Kirill I ; Kuemmeth, Ferdinand ; Ralph, Daniel C. / Imaging electromigration during the formation of break junctions. In: Nano Letters. 2007 ; Vol. 7, No. 3. pp. 652-656.

Bibtex

@article{43357f9ea0704481b15f1afb2712ab06,
title = "Imaging electromigration during the formation of break junctions.",
abstract = "Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.",
author = "Thiti Taychatanapat and Bolotin, {Kirill I} and Ferdinand Kuemmeth and Ralph, {Daniel C}",
year = "2007",
month = jan,
day = "1",
doi = "DOI: 10.1021/nl062631i",
language = "English",
volume = "7",
pages = "652--656",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "3",

}

RIS

TY - JOUR

T1 - Imaging electromigration during the formation of break junctions.

AU - Taychatanapat, Thiti

AU - Bolotin, Kirill I

AU - Kuemmeth, Ferdinand

AU - Ralph, Daniel C

PY - 2007/1/1

Y1 - 2007/1/1

N2 - Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

AB - Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

U2 - DOI: 10.1021/nl062631i

DO - DOI: 10.1021/nl062631i

M3 - Journal article

VL - 7

SP - 652

EP - 656

JO - Nano Letters

JF - Nano Letters

SN - 1530-6984

IS - 3

ER -

ID: 44225491