A technique for positioning nano-particles using an atomic force microscope

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Standard

A technique for positioning nano-particles using an atomic force microscope. / Theil Hansen, L.; Kühle, A.; Sørensen, A.H.; Bohr, J.; Lindelof, P.E.

I: Nanotechnology, Nr. 9, 1998, s. 337.

Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning

Harvard

Theil Hansen, L, Kühle, A, Sørensen, AH, Bohr, J & Lindelof, PE 1998, 'A technique for positioning nano-particles using an atomic force microscope', Nanotechnology, nr. 9, s. 337.

APA

Theil Hansen, L., Kühle, A., Sørensen, A. H., Bohr, J., & Lindelof, P. E. (1998). A technique for positioning nano-particles using an atomic force microscope. Nanotechnology, (9), 337.

Vancouver

Theil Hansen L, Kühle A, Sørensen AH, Bohr J, Lindelof PE. A technique for positioning nano-particles using an atomic force microscope. Nanotechnology. 1998;(9):337.

Author

Theil Hansen, L. ; Kühle, A. ; Sørensen, A.H. ; Bohr, J. ; Lindelof, P.E. / A technique for positioning nano-particles using an atomic force microscope. I: Nanotechnology. 1998 ; Nr. 9. s. 337.

Bibtex

@article{88cd354074c911dbbee902004c4f4f50,
title = "A technique for positioning nano-particles using an atomic force microscope",
author = "{Theil Hansen}, L. and A. K{\"u}hle and A.H. S{\o}rensen and J. Bohr and P.E. Lindelof",
note = "OEL",
year = "1998",
language = "English",
pages = "337",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "Institute of Physics Publishing Ltd",
number = "9",

}

RIS

TY - JOUR

T1 - A technique for positioning nano-particles using an atomic force microscope

AU - Theil Hansen, L.

AU - Kühle, A.

AU - Sørensen, A.H.

AU - Bohr, J.

AU - Lindelof, P.E.

N1 - OEL

PY - 1998

Y1 - 1998

M3 - Journal article

SP - 337

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 9

ER -

ID: 200827