Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012)
Publikation: Andet › Andet bidrag › Forskning
Standard
Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). / Johnson, Erik.
Nagoya University. 2012, -.Publikation: Andet › Andet bidrag › Forskning
Harvard
Johnson, E 2012, Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). Nagoya University. <http://www.esi.nagoya-u.ac.jp/shinpo/poster_20120119.pdf?20121113>
APA
Johnson, E. (2012, jan. 19). Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). http://www.esi.nagoya-u.ac.jp/shinpo/poster_20120119.pdf?20121113
Vancouver
Johnson E. Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012). 2012.
Author
Bibtex
@misc{a4c33bb5f6274a6494cc2cb48335be16,
title = "Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012)",
author = "Erik Johnson",
year = "2012",
month = jan,
day = "19",
language = "English",
type = "Other",
}
RIS
TY - GEN
T1 - Single-Atom Sensitive STEM and TEM of MoS2 Nanocatalysts – Atoms on the Edge, International Symposium on Role of Electron Microscopy in Industry, Nagoya (2012)
AU - Johnson, Erik
PY - 2012/1/19
Y1 - 2012/1/19
M3 - Other contribution
CY - Nagoya University
ER -
ID: 41842980