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3-dimensional strain fields from tomographic measurements. / Haldrup, Martin Kristoffer; Nielsen, S.F.; Mishnaevsky, L. Jr.; Beckmann, F; Wert, J.A.
Proceedings of SPIE vol. 6318: Developments in X-Ray Tomography V, 15 August 2006, San Diego, USA. Bind 6318 SPIE - International Society for Optical Engineering, 2006.
Publikation: Bidrag til bog/antologi/rapport › Konferencebidrag i proceedings › Forskning › fagfællebedømt
Harvard
Haldrup, MK, Nielsen, SF, Mishnaevsky, LJ, Beckmann, F & Wert, JA 2006,
3-dimensional strain fields from tomographic measurements. i
Proceedings of SPIE vol. 6318: Developments in X-Ray Tomography V, 15 August 2006, San Diego, USA. bind 6318, SPIE - International Society for Optical Engineering, Developments in X-Ray Tomography V, San Diego, USA,
15/08/2006.
https://doi.org/10.1117/12.679043APA
Haldrup, M. K., Nielsen, S. F., Mishnaevsky, L. J., Beckmann, F., & Wert, J. A. (2006).
3-dimensional strain fields from tomographic measurements. I
Proceedings of SPIE vol. 6318: Developments in X-Ray Tomography V, 15 August 2006, San Diego, USA (Bind 6318). SPIE - International Society for Optical Engineering.
https://doi.org/10.1117/12.679043Vancouver
Haldrup MK, Nielsen SF, Mishnaevsky LJ, Beckmann F, Wert JA.
3-dimensional strain fields from tomographic measurements. I Proceedings of SPIE vol. 6318: Developments in X-Ray Tomography V, 15 August 2006, San Diego, USA. Bind 6318. SPIE - International Society for Optical Engineering. 2006
https://doi.org/10.1117/12.679043Author
Haldrup, Martin Kristoffer ; Nielsen, S.F. ; Mishnaevsky, L. Jr. ; Beckmann, F ; Wert, J.A. / 3-dimensional strain fields from tomographic measurements. Proceedings of SPIE vol. 6318: Developments in X-Ray Tomography V, 15 August 2006, San Diego, USA. Bind 6318 SPIE - International Society for Optical Engineering, 2006.
Bibtex
@inproceedings{8d1d46d0ec5e11ddbf70000ea68e967b,
title = "3-dimensional strain fields from tomographic measurements",
abstract = "Tomography",
author = "Haldrup, {Martin Kristoffer} and S.F. Nielsen and Mishnaevsky, {L. Jr.} and F Beckmann and J.A. Wert",
year = "2006",
doi = "10.1117/12.679043",
language = "English",
volume = "6318",
booktitle = "Proceedings of SPIE vol. 6318",
publisher = "SPIE - International Society for Optical Engineering",
note = "null ; Conference date: 15-08-2006",
}
RIS
TY - GEN
T1 - 3-dimensional strain fields from tomographic measurements
AU - Haldrup, Martin Kristoffer
AU - Nielsen, S.F.
AU - Mishnaevsky, L. Jr.
AU - Beckmann, F
AU - Wert, J.A.
PY - 2006
Y1 - 2006
N2 - Tomography
AB - Tomography
U2 - 10.1117/12.679043
DO - 10.1117/12.679043
M3 - Article in proceedings
VL - 6318
BT - Proceedings of SPIE vol. 6318
PB - SPIE - International Society for Optical Engineering
Y2 - 15 August 2006
ER -
