In this thesis, the structural characterizations of three organic film systems are described. Several X-ray based techniques have been utilized for the characterizations for different research goals.
The structures of N,N',N-trioctyltriazatriangulenium (Oct3-TATA+) salts have
been investigated by optical, surface and X-ray method. We describe the production of Langmuir-Blodgett film and how the absorption spectroscopy is a powerful tool to identify layer of monomer and dimer. X-ray refelctometry has been applied as a method for the study of the multilayer film and interface structure.
A separation of small molecule and polymer layers is indicated by Flory-
Huggins theory for the triisopropylsilylethynl pentacene (TIPS-PEN) and polystyrene blend films. In order to investigate the phase separated layers in the ink-jet printed films, we propose a method to measure diraction Bragg peaks by X-ray standing waves. A preliminary experiment has been shown and the results imply a three-layer TIPS-PEN/PS/TIPS-PEN segregated film.
In the last part of the thesis, the time-resolved X-ray diffraction is applied to the study ferroelectric capacitors of copolymer(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)). The early stage result shows a periodic lattice deformation in direction parallel to the electric field following the driving electric field. The timeresolved X-ray diffraction can be employed to investigate the crystal deformations of switching capacitor dynamically and hysteresis properties simultaneously.