Dephasing in semiconductor-superconductor structures by coupling to a voltage probe
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Dephasing in semiconductor-superconductor structures by coupling to a voltage probe. / Mortensen, Niels Asger; Jauho, Antti-Pekka; Flensberg, Karsten.
I: Superlattices and Microstructures, Bind 28, Nr. 1, 2000, s. 67-76.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
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TY - JOUR
T1 - Dephasing in semiconductor-superconductor structures by coupling to a voltage probe
AU - Mortensen, Niels Asger
AU - Jauho, Antti-Pekka
AU - Flensberg, Karsten
N1 - Paper id:: http://dx.doi.org/10.1006/spmi.2000.0890
PY - 2000
Y1 - 2000
N2 - We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.
AB - We study dephasing in semiconductor-superconductor structures caused by coupling to a voltage probe. We consider structures where the semiconductor consists of two scattering regions between which partial dephasing is possible. As a particular example we consider a situation with a double barrier junction in the normal region. For a single-mode system we study the conductance both as a function of the position of the Fermi level and as a function of the barrier transparency. At resonance, where the double barrier is fully transparent, we study the suppression of the ideal factor-of-two enhancement of the conductance when a finite coupling to the voltage probe is taken into account.
M3 - Journal article
VL - 28
SP - 67
EP - 76
JO - Superlattices and Microstructures
JF - Superlattices and Microstructures
SN - 0749-6036
IS - 1
ER -
ID: 176415