X-ray dark-field and phase-contrast imaging using a grating interferometer

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Standard

X-ray dark-field and phase-contrast imaging using a grating interferometer. / Pfeiffer, F.; Bech, Martin; Bunk, O.; Donath, T.

I: Journal of Applied Physics, Bind 105, Nr. 10, 2009, s. 102006.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningfagfællebedømt

Harvard

Pfeiffer, F, Bech, M, Bunk, O & Donath, T 2009, 'X-ray dark-field and phase-contrast imaging using a grating interferometer', Journal of Applied Physics, bind 105, nr. 10, s. 102006. https://doi.org/10.1063/1.3115639

APA

Pfeiffer, F., Bech, M., Bunk, O., & Donath, T. (2009). X-ray dark-field and phase-contrast imaging using a grating interferometer. Journal of Applied Physics, 105(10), 102006. https://doi.org/10.1063/1.3115639

Vancouver

Pfeiffer F, Bech M, Bunk O, Donath T. X-ray dark-field and phase-contrast imaging using a grating interferometer. Journal of Applied Physics. 2009;105(10):102006. https://doi.org/10.1063/1.3115639

Author

Pfeiffer, F. ; Bech, Martin ; Bunk, O. ; Donath, T. / X-ray dark-field and phase-contrast imaging using a grating interferometer. I: Journal of Applied Physics. 2009 ; Bind 105, Nr. 10. s. 102006.

Bibtex

@article{5f7080c016e311df8ed1000ea68e967b,
title = "X-ray dark-field and phase-contrast imaging using a grating interferometer",
abstract = "Udgivelsesdato: 15 May",
author = "F. Pfeiffer and Martin Bech and O. Bunk and T. Donath",
year = "2009",
doi = "10.1063/1.3115639",
language = "English",
volume = "105",
pages = "102006",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics",
number = "10",

}

RIS

TY - JOUR

T1 - X-ray dark-field and phase-contrast imaging using a grating interferometer

AU - Pfeiffer, F.

AU - Bech, Martin

AU - Bunk, O.

AU - Donath, T.

PY - 2009

Y1 - 2009

N2 - Udgivelsesdato: 15 May

AB - Udgivelsesdato: 15 May

U2 - 10.1063/1.3115639

DO - 10.1063/1.3115639

M3 - Journal article

VL - 105

SP - 102006

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 10

ER -

ID: 17553734