Electron-electron scattering in linear transport in two-dimensional systems
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Electron-electron scattering in linear transport in two-dimensional systems. / Hu, Ben Yu-Kuang; Flensberg, Karsten.
I: Physical Review B, Bind 53, Nr. 15, 15.04.1996, s. 10072-10077.Publikation: Bidrag til tidsskrift › Tidsskriftartikel › Forskning › fagfællebedømt
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TY - JOUR
T1 - Electron-electron scattering in linear transport in two-dimensional systems
AU - Hu, Ben Yu-Kuang
AU - Flensberg, Karsten
PY - 1996/4/15
Y1 - 1996/4/15
N2 - We describe a method for numerically incorporating electron-electron scattering in quantum wells for small deviations of the distribution function from equilibrium, within the framework of the Boltzmann equation. For a given temperature T and density n, a symmetric matrix needs to be evaluated only once, and henceforth it can be used to describe electron-electron scattering in any Boltzmann equation linear-response calculation for that particular T and n. Using this method, we calculate the distribution function and mobility for electrons in a quantum well, including full finite-temperature dynamic screening effects. We find that at some parameters that we investigated, electron-electron scattering reduces the mobility by approximately 40%.
AB - We describe a method for numerically incorporating electron-electron scattering in quantum wells for small deviations of the distribution function from equilibrium, within the framework of the Boltzmann equation. For a given temperature T and density n, a symmetric matrix needs to be evaluated only once, and henceforth it can be used to describe electron-electron scattering in any Boltzmann equation linear-response calculation for that particular T and n. Using this method, we calculate the distribution function and mobility for electrons in a quantum well, including full finite-temperature dynamic screening effects. We find that at some parameters that we investigated, electron-electron scattering reduces the mobility by approximately 40%.
U2 - 10.1103/PhysRevB.53.10072
DO - 10.1103/PhysRevB.53.10072
M3 - Journal article
C2 - 9982572
VL - 53
SP - 10072
EP - 10077
JO - Physical Review B
JF - Physical Review B
SN - 2469-9950
IS - 15
ER -
ID: 129607434