Membrane-Based Scanning Force Microscopy

Research output: Contribution to journal › Journal article › Research › peer-review

Standard

Membrane-Based Scanning Force Microscopy. / Halg, David; Gisler, Thomas; Tsaturyan, Yeghishe; Catalini, Letizia; Grob, Urs; Krass, Marc-Dominik; Heritier, Martin; Mattiat, Hinrich; Thamm, Ann-Katrin; Schirhagl, Romana; Langman, Eric C.; Schliesser, Albert; Degen, Christian L.; Eichler, Alexander.

In: Physical Review Applied, Vol. 15, No. 2, 021001, 05.02.2021.

Research output: Contribution to journal › Journal article › Research › peer-review

Harvard

Halg, D, Gisler, T, Tsaturyan, Y, Catalini, L, Grob, U, Krass, M-D, Heritier, M, Mattiat, H, Thamm, A-K, Schirhagl, R, Langman, EC, Schliesser, A, Degen, CL & Eichler, A 2021, 'Membrane-Based Scanning Force Microscopy', Physical Review Applied, vol. 15, no. 2, 021001. https://doi.org/10.1103/PhysRevApplied.15.L021001

APA

Halg, D., Gisler, T., Tsaturyan, Y., Catalini, L., Grob, U., Krass, M-D., Heritier, M., Mattiat, H., Thamm, A-K., Schirhagl, R., Langman, E. C., Schliesser, A., Degen, C. L., & Eichler, A. (2021). Membrane-Based Scanning Force Microscopy. Physical Review Applied, 15(2), [021001]. https://doi.org/10.1103/PhysRevApplied.15.L021001

Vancouver

Halg D, Gisler T, Tsaturyan Y, Catalini L, Grob U, Krass M-D et al. Membrane-Based Scanning Force Microscopy. Physical Review Applied. 2021 Feb 5;15(2). 021001. https://doi.org/10.1103/PhysRevApplied.15.L021001

Author

Halg, David ; Gisler, Thomas ; Tsaturyan, Yeghishe ; Catalini, Letizia ; Grob, Urs ; Krass, Marc-Dominik ; Heritier, Martin ; Mattiat, Hinrich ; Thamm, Ann-Katrin ; Schirhagl, Romana ; Langman, Eric C. ; Schliesser, Albert ; Degen, Christian L. ; Eichler, Alexander. / Membrane-Based Scanning Force Microscopy. In: Physical Review Applied. 2021 ; Vol. 15, No. 2.

Bibtex

@article{c80aa9ef3566429e896be468c821e5c8,
title = "Membrane-Based Scanning Force Microscopy",
abstract = "We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry-in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.",
author = "David Halg and Thomas Gisler and Yeghishe Tsaturyan and Letizia Catalini and Urs Grob and Marc-Dominik Krass and Martin Heritier and Hinrich Mattiat and Ann-Katrin Thamm and Romana Schirhagl and Langman, {Eric C.} and Albert Schliesser and Degen, {Christian L.} and Alexander Eichler",
note = "Hy-Q",
year = "2021",
month = feb,
day = "5",
doi = "10.1103/PhysRevApplied.15.L021001",
language = "English",
volume = "15",
journal = "Physical Review Applied",
issn = "2331-7019",
publisher = "American Physical Society",
number = "2",

}

RIS

TY - JOUR

T1 - Membrane-Based Scanning Force Microscopy

AU - Halg, David

AU - Gisler, Thomas

AU - Tsaturyan, Yeghishe

AU - Catalini, Letizia

AU - Grob, Urs

AU - Krass, Marc-Dominik

AU - Heritier, Martin

AU - Mattiat, Hinrich

AU - Thamm, Ann-Katrin

AU - Schirhagl, Romana

AU - Langman, Eric C.

AU - Schliesser, Albert

AU - Degen, Christian L.

AU - Eichler, Alexander

N1 - Hy-Q

PY - 2021/2/5

Y1 - 2021/2/5

N2 - We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry-in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.

AB - We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry-in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.

U2 - 10.1103/PhysRevApplied.15.L021001

DO - 10.1103/PhysRevApplied.15.L021001

M3 - Journal article

VL - 15

JO - Physical Review Applied

JF - Physical Review Applied

SN - 2331-7019

IS - 2

M1 - 021001

ER -

ID: 258656959