Standard
CBED crystal polarity analysis of compound semiconductor nanostructures. / Spiecker, E.; Jäger, W.; Johnson, Erik; Aagesen, Martin; Sørensen, C.B.; Lindelof, Poul Erik.
In:
Microscopy and Microanalysis, Vol. 13, No. Suppl. 3, 2007, p. 120-121.
Research output: Contribution to journal › Conference article › Research
Harvard
Spiecker, E, Jäger, W, Johnson, E, Aagesen, M, Sørensen, CB & Lindelof, PE 2007, 'CBED crystal polarity analysis of compound semiconductor nanostructures', Microscopy and Microanalysis, vol. 13, no. Suppl. 3, pp. 120-121.
APA
Spiecker, E., Jäger, W., Johnson, E., Aagesen, M., Sørensen, C. B., & Lindelof, P. E. (2007). CBED crystal polarity analysis of compound semiconductor nanostructures. Microscopy and Microanalysis, 13(Suppl. 3), 120-121.
Vancouver
Spiecker E, Jäger W, Johnson E, Aagesen M, Sørensen CB, Lindelof PE. CBED crystal polarity analysis of compound semiconductor nanostructures. Microscopy and Microanalysis. 2007;13(Suppl. 3):120-121.
Author
Spiecker, E. ; Jäger, W. ; Johnson, Erik ; Aagesen, Martin ; Sørensen, C.B. ; Lindelof, Poul Erik. / CBED crystal polarity analysis of compound semiconductor nanostructures. In: Microscopy and Microanalysis. 2007 ; Vol. 13, No. Suppl. 3. pp. 120-121.
Bibtex
@inproceedings{a80bcaf0beb711dcbee902004c4f4f50,
title = "CBED crystal polarity analysis of compound semiconductor nanostructures",
author = "E. Spiecker and W. J{\"a}ger and Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik}",
year = "2007",
language = "English",
volume = "13",
pages = "120--121",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "Suppl. 3",
note = "null ; Conference date: 02-09-2007 Through 07-09-2007",
}
RIS
TY - GEN
T1 - CBED crystal polarity analysis of compound semiconductor nanostructures
AU - Spiecker, E.
AU - Jäger, W.
AU - Johnson, Erik
AU - Aagesen, Martin
AU - Sørensen, C.B.
AU - Lindelof, Poul Erik
N1 - Conference code: 33
PY - 2007
Y1 - 2007
M3 - Conference article
VL - 13
SP - 120
EP - 121
JO - Microscopy and Microanalysis
JF - Microscopy and Microanalysis
SN - 1431-9276
IS - Suppl. 3
Y2 - 2 September 2007 through 7 September 2007
ER -
