CBED crystal polarity analysis of compound semiconductor nanostructures

Research output: Contribution to journalConference articleResearch

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume13
Issue numberSuppl. 3
Pages (from-to)120-121
Number of pages2
ISSN1431-9276
Publication statusPublished - 2007
EventMC 2007 :  Conference of the DGE,  Deutschen Gesellschaft für elektronmikroskopie e.V. - Saarbrücken, Germany
Duration: 2 Sep 20077 Sep 2007
Conference number: 33

Conference

ConferenceMC 2007 :  Conference of the DGE,  Deutschen Gesellschaft für elektronmikroskopie e.V.
Number33
CountryGermany
CitySaarbrücken
Period02/09/200707/09/2007

ID: 2211515